Proceedings of International Conference on Intelligent Manufacturing and Automation by Hari Vasudevan & Vijaya Kumar N. Kottur & Amool A. Raina

Author:Hari Vasudevan & Vijaya Kumar N. Kottur & Amool A. Raina
Language: eng
Format: epub
ISBN: 9789811324901
Publisher: Springer Singapore

3 Result and Discussion

3.1 Material Characterization

3.1.1 Structural Properties (X-Ray Diffraction Analysis)

X-ray diffractometry of undoped and Pd-doped ZnO powders was carried out using BRUKER AXSD8 (Germany) advance model X-ray diffraction with CuKα1 (λ = 1.54056 Å) radiation in the 2θ range 20°–80°. The scanning speed of the sample was kept 0.5°/min.

Figure 1 shows XRD spectra of undoped and Pd-doped ZnO nanostructures. The highest peaks of ZnO are obtained at (101), (002), and (110) planes. It is observed that two additional peaks are obtained at 30.61° and 57.43° for Pd-doped ZnO, and these peaks can be associated with PdO [27]. The intensities of the peaks obtained at 30.61° and 57.43° increase with increase in percentage of Pd doping in ZnO. From the XRD results, it is observed that 1 wt% Pd, 3 wt% Pd, and 6 wt% Pd in ZnO are more crystalline as compared to pure ZnO.

Fig. 1XRD of pure ZnO, 1 wt% Pd, 3 wt% Pd, and 6 wt% Pd in ZnO

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